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2 edition of Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS found in the catalog.

Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS

IEEE International Conference on Microelectronic Test Structures (1988

Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS

Long Beach Hyatt Regency, Long Beach, California, February 22-23, 1988

by IEEE International Conference on Microelectronic Test Structures (1988

  • 399 Want to read
  • 30 Currently reading

Published by IEEE in [Silver Spring?, Md.] .
Written in English

    Subjects:
  • Miniature electronic equipment -- Testing.,
  • Electronic apparatus and appliances -- Testing.,
  • Reliability (Engineering)

  • Edition Notes

    Other titlesMicroelectronic test structures., ICMTS.
    Statementsponsored by IEEE Electron Devices Society.
    ContributionsIEEE Electron Devices Society.
    Classifications
    LC ClassificationsTK7870 .I435 1988
    The Physical Object
    Pagination206 p. ;
    Number of Pages206
    ID Numbers
    Open LibraryOL19261061M

    IEEE Conferences Committee formulates and recommends actions, strategies, and policies for IEEE conferences. It provides oversight for conference-related activities, has jurisdiction over all 1,+ IEEE global conferences, and ensures compliance per all IEEE Policies - Section 10 (PDF, 1 MB).. The committee is administratively a standing committee of TAB with members from IEEE Technical.   U. Schaper, J. Einfeld, A. Sauerbrey, "Parameter Variation on Chip-Level”, in Proceedings of the International Conference on Microelectronic Test Structures (ICMTS), Google Scholar J. Johnson, T. Hook, Y.-M. Lee, "Analysis and modeling of threshold voltage mismatch for CMOS at 65 nm and beyond”, IEEE Electron Device Lett.

    IEEE Int. Conference on Microelectronic Test Structures, Vol 2, No. 1, March Fig. 3. Propagation-delay versus load for the inverter chain. The test circuit is part of a CMOS Process Control Module (PCM) and incorporates test structures for the evaluation of process-parameters, SPICE-mosfet model-parameters and circuit-parameters. "AIM-Lab - A System for Conducting Semiconductor Device Characterization via the Internet", M.S. Shur, T.A. Fjeldly, and H. Shen, Late news paper, The International Conference on Microelectronic Test Structures (ICMTS ), Gøteborg, Sweden, March ().

    F. Driussi, , , Duuren and Shaijk, "On The Passivation of Interface States in SONOS test structures: impact of device layout and annealing process", Proceeding of the IEEE International Conference on Microelectronic Test Structures (ICMTS), , p;. IEEE membership offers access to technical innovation, cutting-edge information, networking opportunities, and exclusive member benefits. Members support IEEE's mission to advance technology for humanity and the profession, while memberships build a platform to introduce careers in technology to students around the world.


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Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures, ICMTS by IEEE International Conference on Microelectronic Test Structures (1988 Download PDF EPUB FB2

The International Conference on Microelectronic Test Structures (ICMTS) is the premier conference devoted to the development, measurement and analysis of test structures providing a forum for designers and users of test structures to discuss recent developments and future directions The meeting is a IEEE conference, sponsored by the IEEE.

IEEE International Conference on Microelectronic Test Structures ( Long Beach, Calif.). Proceedings of the IEEE International Conference on Microelectronic Test Structures ICMTS.

New York, N.Y.: Institute of Electrical and Electronics Engineers, © [i.e. ] (OCoLC) Material Type: Conference publication, Internet.

IEEE International Conference on Microelectronic Test Structures ( Long Beach, Calif.). Proceedings of the IEEE International Conference on Microelectronic Test Structures ICMTS. New York, N.Y.: Institute of Electrical and Electronics Engineers, © [i.e.

] (DLC) (OCoLC) Material Type. ICMTSproceedings of the IEEE International Conference on Microelectronic Test Structures, March, Kanazawa, Japan sponsored by the IEEE Electron Devices Society Institute of Electrical and Electronics Engineers, c soft.: case.

He is a Proceedings of the 1988 IEEE International Conference on Microelectronic Test Structures of the IEEE, was an editor of the IEEE Transactions on Electron Devices from toand has been an editor of the IEEE Journal of the Electron Devices Society since He is or has been on the technical program committees for the IEEE BCTM, ICMTS.

30th IEEE International Conference on Microelectronic Test Structures (ICMTS) Exhibition on March; Maison MINATEC, Grenoble, France Participating Division: Advanced Semiconductor Test; Events.

SEMICON China OFC All About Photonics 94th ARFTG Microwave Measurement Conference. Asia-Pacific Microwave. ICMTS IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES Embassy Suites March 30 – April 2, Mandalay Beach Hotel Oxnard, CA Sponsored by the IEEE Electron Devices Society.

This paper demonstrates the use of electrical test structures patterned on silicon-on-insulator (SOI) material to evaluate the performance of the plasma etching process. ICMTS Proceedings of the International Conference on Microelectronic Test Structures: Subtitle of host publication: Kobe, Japan, March Proceedings.

The proceedings of this conference will be available for purchase through Curran Associates. Microelectronic Test Structures (ICMTS), IEEE International Conference on.

Print on Demand Purchase at Partner; External Hard-drive Purchase at Partner. Read Now Icmts IEEE International Conference on Microelectronic Test Structures: Mar.

Proceedings of the International Conference on Microelectronic Test Structures This paper will look at both technical and business advantages of parallel vs. serial inline parametric testing, secondary effects of changing test strategies, quantifying return on investment of newer test strategies, and next steps in pushing the envelope of test.

IEEE International Conference on Microelectronic Test Structures. Country: United Kingdom - SIR Ranking of United Kingdom: Electrical and Electronic Engineering: Publisher: Publication type: Conferences and Proceedings: ISSN: Coverage: ongoing: Homepage.

Join the conversation about this journal International. Groenland, AW, Wolters, RAM, Kovalgin, AY & Schmitz, JFour point probe structures with buried electrodes for the electrical characterization of ultrathin conducting films.

in Proceedings of the IEEE International Conference on Microelectronic Test Structures., /ICMTS, IEEE Computer Society Press, Piscataway, pp. Conference: Microelectronic Test Structures, ICMTS Proceedings.

IEEE International Conference on. Cite this publication The book features a detailed tutorial and in-depth. 29th IEEE International Conference on Microelectronic Test Structures, ICMTS - Yokohama, Japan Duration: 28 Mar → 31 Mar the development and process verification of microelectrodes for high temperature operation in molten salts.

in 29th IEEE ICMTS Conference Proceedings: MarchMielparque Yokohama, Japan.,IEEE. Stavitski, N, Klootwijk, JH, van Zeijl, HW, Kovalgin, AY & Wolters, RAMA study of cross-bridge kelvin resistor structures for reliable measurement of low contact resistances.

in Proceedings of the 21st ICMTS IEEE Conference on Microelectronic Test Structures., /ICMTS, IEEE Computer Society, Piscataway, pp.

The IEEE International Conference on Microelectronic Test Structures (ICMTS) will be held at the University of Edinburgh, which recently celebrated its th anniversary.

ICMTS has come of age and this meeting celebrates its 21st anniversary by visiting Edin-burgh for the second time. The conference is being run in cooperation. A test chip has been fabricated that includes structures with a wide range of dimensions and provides the capability to characterise enhanced droplet manipulation as well as other integrated functions.

In particular, we detail the use of EWOD to anchor droplets while SAW excitation is. The 18th International Conference on Microelectronic Test Struc-tures (ICMTS) will be held at the Katholieke Universiteit in Leuven, Belgium AprilThe conference will be preceded by a one-day Tutorial Short Course on Microelectronic Test Structures on April 4, This conference will be sponsored by the IEEE Electron Devices Society.

With the highest ESD level in a smallest layout area, SCR device was used as effective on-chip ESD protection device in CMOS technology. In this paper, a waffle layout test structure of SCR is proposed to investigate the current spreading efficiency for ESD protection.

Ker, M. D., & Lin, C. Y. (). Test structure on SCR device in waffle layout for RF ESD IEEE International Conference on Microelectronic Test Structures, ICMTS - Conference Proceedings (pp.

).[] (IEEE International Conference on Microelectronic Test Structures).D.J. Radack and L.W. Linholm, The Application pf Microelectronic Test Structures For Propagation Delay Measurements, IEEE Workshop On Test Structures, pp. In: Proceedings of the IEEE International Conference on Microelectronic Test Structures, ICMTS, pp.

87–92 () Google Scholar 9. Agarwal, A., Blaauw, D., Zolotov V.: Statistical timing analysis for intra-die process variations with spatial correlations.